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Related Experiment Video

Updated: Jun 20, 2026

Implementation of a Reference Interferometer for Nanodetection

Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

Collinear interferometer with variable delay for carrier-envelope offset frequency measurement.

Monika Pawłowska¹, Filip Ozimek, Piotr Fita

¹Institute of Experimental Physics, University of Warsaw, ul. Hoza 69, 00-681 Warsaw, Poland. monika@kopernik.edu.pl

The Review of Scientific Instruments

|September 4, 2009

Summary

This summary is machine-generated.

We present a new method for measuring carrier-envelope offset frequency in femtosecond optical frequency combs. This common-path interferometer design offers superior stability compared to traditional setups.

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Area of Science:

Optics and Photonics
Frequency Metrology
Ultrafast Lasers

Background:

Accurate measurement of carrier-envelope offset frequency is crucial for optical frequency combs.
Conventional interferometric methods can suffer from environmental instabilities.
Microstructured fiber systems require precise control over pulse delay.

Purpose of the Study:

To demonstrate a novel common-path interferometer scheme for measuring carrier-envelope offset frequency.
To provide a more stable alternative to standard interferometers for femtosecond optical frequency combs.
To achieve a large delay range suitable for microstructured fiber applications.

Main Methods:

Utilizing a common-path interferometer configuration.
Employing a calcite Babinet-Soleil compensator for precise delay control.
Achieving a delay range of up to 8 picoseconds.

Main Results:

Successfully demonstrated a novel scheme for carrier-envelope offset frequency measurement.
The common-path arrangement exhibited superior stability compared to standard interferometers.
The device's large delay range is compatible with spectral broadening in microstructured fibers.

Conclusions:

The developed common-path interferometer offers a robust and stable method for carrier-envelope offset frequency measurement.
This technique enhances the performance of femtosecond optical frequency combs, particularly in systems utilizing spectral broadening.
The findings pave the way for more reliable frequency metrology in ultrafast laser systems.