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Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
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Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Published on: April 18, 2019

Saturation effects in the carrier-induced refractive index in a semiconductor gain medium

W W Chow, G C Dente, D Depatie

    Optics Letters
    |September 10, 2009
    PubMed

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