Related Experiment Video
Updated: Jun 20, 2026

Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization
Published on: September 8, 2023
Frequency- and polarization-selective Schottky detectors in the visible and near ultraviolet
Abstract:
The influence of dielectric coatings on the photoresponsivity of metal-insulator-semiconductor structures on holographic submicrometer sinusoidal grating structures is investigated. Narrow-band photodetectors are realized based on the excitation of transverse electric modes and surface plasmon polaritons in the vacuum-MgF(2)-Al or vacuum-SiO(2)-A1 layer system on Si substrates. These detectors are sensitive to either s- or p-polarized light. Quantum efficiencies up to 20% and a linewidth of 18 mm were achieved with transverse electric modes at a wavelength lambda = 325 nm. The resonances are tunable from the ultraviolet into the visible regime by variation of the dielectric film thickness.
Related Concept Videos
UV–Vis Spectrometers
Ultraviolet and Visible (UV–Vis) Spectroscopy: Overview
Schottky Barrier Diode
Gas Chromatography: Types of Detectors-II
UV–Vis Spectroscopy: Molecular Electronic Transitions
Determination of Crystal Structures
