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Updated: Jun 20, 2026

A Random-displacement Measurement by Combining a Magnetic Scale and Two Fiber Bragg Gratings

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Published on: September 30, 2019

Interferometer for measuring displacement and distance.

T Kubota, M Nara, T Yoshino

|September 10, 2009

Summary

This study presents a simple laser diode interferometer for precise relative displacement and absolute distance measurements. It achieves high accuracy for both measurements over several meters using a lambda/8 plate and FM radar techniques.

Area of Science:

Optoelectronics
Metrology
Laser Physics

Background:

Accurate measurement of displacement and distance is crucial in various scientific and industrial applications.
Traditional interferometers can be complex and limited in their measurement capabilities.

Purpose of the Study:

To develop a simple and versatile interferometer for measuring both relative displacement and absolute distance.
To demonstrate the effectiveness of a laser diode-based system for high-accuracy metrology.

Main Methods:

Fabrication of a simple interferometer utilizing a laser diode.
Employing a lambda/8 plate for detecting the sign of displacement.
Utilizing a Frequency Modulation (FM) radar technique by modulating the laser diode frequency for distance measurement.

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Implementation of a Reference Interferometer for Nanodetection

Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

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Implementation of a Reference Interferometer for Nanodetection

Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

Main Results:

Achieved measurement accuracy of 0.02 micrometers for relative displacement.
Obtained measurement accuracy of 100 micrometers for absolute distance.
Demonstrated reliable measurements over a range of a few meters.

Conclusions:

The developed laser diode interferometer offers a simple yet effective solution for precise displacement and distance metrology.
The combination of a lambda/8 plate and FM radar technique enables accurate and unambiguous measurements.
This system provides a practical tool for applications requiring high-accuracy measurements in optics and engineering.