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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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Precision Milling of Carbon Nanotube Forests Using Low Pressure Scanning Electron Microscopy
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Nanotechnology: A gentle jackhammer

Enrico Gnecco1

  • 1Enrico Gnecco is in the National Center of Competence in Research 'Nanoscale Science', Department of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, Switzerland. enrico.gnecco@unibas.ch.

Nature
|September 11, 2009
PubMed
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No abstract available in PubMed .

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