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Updated: Jun 20, 2026

13:05
Plasma-Assisted Molecular Beam Epitaxy Growth of Mg3N2 and Zn3N2 Thin Films
Published on: May 11, 2019
Nondestructive depth profiling of ZnS and MgO films by spectroscopic ellipsometry
Optics Letters
|September 11, 2009
Abstract:
Spectroscopic ellipsometric (SE) measurements followed by linear-regression analysis of the SE data obtained on ZnS and MgO films on vitreous silica substrates reveal the distribution of voids (or low-density regions) in these transparent thin films.
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