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Identification of AF drivers: toward a mechanistic basis of AF ablation

Kentaro Yoshida, Aman Chugh

    Pacing and Clinical Electrophysiology : PACE
    |September 12, 2009
    PubMed
    Abstract

    No abstract available in PubMed .

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    Atomic Force Microscopy

    Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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    The probe is regarded as the heart of any AFM setup and comprises the...