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Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities
Published on: November 30, 2012
Characterization of silica-based waveguides with an interferometric optical time-domain reflectometry system using a
Optics Letters
|September 16, 2009
Abstract:
Backscattering of silica-based glass waveguides is characterized for the first time to our knowledge by using an interferometric optical time-domain reflectometry system. High spatial resolution, as short as 15 microm, is obtained by using a newly developed 1.3-microm-wavelength superluminescent diode. Scattering centers produced by waveguide irregularities are clearly observed in glass optical waveguides. Waveguide loss and bend loss in the curved regions are estimated from the backscattered light intensity distribution.
