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Updated: Feb 8, 2026

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Electrochemical studies of capacitance in cerium oxide thin films and its relationship to anionic and electronic
William C Chueh1, Sossina M Haile
1Department of Materials Science, California Institute of Technology, Pasadena, CA 91125, USA.
Abstract:
Small polaron carrier density in epitaxial, doped CeO(2) thin films under low oxygen partial pressure was determined from electrochemically-measured capacitance after accounting for interfacial effects and shown to agree well with bulk values.
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