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An Experimental Protocol for Femtosecond NIR/UV - XUV Pump-Probe Experiments with Free-Electron Lasers
Published on: October 23, 2018
High-intensity subpicosecond XeCl laser system
Optics Letters
|September 18, 2009
Summary
A new terawatt-class laser system using XeCl discharge amplifiers generates high-energy, ultrashort pulses. This laser achieves ultra-high focused intensities, enabling advanced scientific research.
Area of Science:
- High-intensity laser physics
- Ultrafast optics
- Plasma science
Background:
- Development of high-power laser systems is crucial for scientific advancement.
- Subpicosecond pulse amplification presents unique technical challenges.
Purpose of the Study:
- To describe a terawatt-class laser system utilizing XeCl discharge amplifiers.
- To characterize the performance and focused intensity of the laser system.
Main Methods:
- Amplification of subpicosecond pulses in XeCl discharge amplifiers.
- Characterization of pulse energy, duration, and focal spot dimensions.
- Utilizing f/3.7 and f/1 optics for focusing.
Main Results:
- Generation of 250-mJ, 335-fsec pulses at a 1-Hz repetition rate.
- Measured focal-spot dimensions of 3.4 µm x 4.1 µm with f/3.7 optics.
- Achieved mean focal volume intensity of 4.6 x 10^18 W/cm^2.
- Demonstrated capability for focused intensity of 6.4 x 10^19 W/cm^2 with f/1 optics.
Conclusions:
- The described terawatt-class laser system reliably produces high-energy, ultrashort pulses.
- The system achieves ultra-high focused intensities, paving the way for new experimental regimes.
- This laser technology is suitable for advanced applications in high-field physics and inertial confinement fusion research.

