High-intensity subpicosecond XeCl laser system
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Updated: Jun 20, 2026

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An Experimental Protocol for Femtosecond NIR/UV - XUV Pump-Probe Experiments with Free-Electron Lasers
Published on: October 23, 2018
Optics Letters
|September 18, 2009
Abstract:
A terawatt-class laser, based on the amplification of subpicosecond pulses in XeCl discharge amplifiers, is described. The system generates 250-mJ, 335-fsec pulses at a sustained 1-Hz repetition rate. Using f/3.7 optics, focal-spot dimensions of 3.4 microm x 4.1 microm are measured for the fully amplified output beam, thus demonstrating a mean focalvolume intensity of 4.6 x 10(18) W/cm(2). With f/l optics, this system is therefore capable of producing a focused intensity of 6.4 x 10(19) W/cm(2).

