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An Experimental Protocol for Femtosecond NIR/UV - XUV Pump-Probe Experiments with Free-Electron Lasers

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High-intensity subpicosecond XeCl laser system.

A J Taylor, C R Tallman, J P Roberts

|September 18, 2009

Summary

This summary is machine-generated.

A new terawatt-class laser system using XeCl discharge amplifiers generates high-energy, ultrashort pulses. This laser achieves ultra-high focused intensities, enabling advanced scientific research.

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Area of Science:

High-intensity laser physics
Ultrafast optics
Plasma science

Background:

Development of high-power laser systems is crucial for scientific advancement.
Subpicosecond pulse amplification presents unique technical challenges.

Purpose of the Study:

To describe a terawatt-class laser system utilizing XeCl discharge amplifiers.
To characterize the performance and focused intensity of the laser system.

Main Methods:

Amplification of subpicosecond pulses in XeCl discharge amplifiers.
Characterization of pulse energy, duration, and focal spot dimensions.
Utilizing f/3.7 and f/1 optics for focusing.

Main Results:

Generation of 250-mJ, 335-fsec pulses at a 1-Hz repetition rate.
Measured focal-spot dimensions of 3.4 µm x 4.1 µm with f/3.7 optics.
Achieved mean focal volume intensity of 4.6 x 10^18 W/cm^2.
Demonstrated capability for focused intensity of 6.4 x 10^19 W/cm^2 with f/1 optics.

Conclusions:

The described terawatt-class laser system reliably produces high-energy, ultrashort pulses.
The system achieves ultra-high focused intensities, paving the way for new experimental regimes.
This laser technology is suitable for advanced applications in high-field physics and inertial confinement fusion research.