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Published on: April 3, 2020
Analysis of the blurring in stencil lithography
O Vazquez-Mena1, L G Villanueva, V Savu
1Microsystems Laboratory, Ecole Polytechnique Fédérale de Lausanne, 1015, Lausanne, Switzerland. oscar.vazquez@epfl.ch
Nanotechnology
|September 19, 2009
Summary
Blurring in stencil lithography increases linearly with stencil-substrate gap. Reducing deposition thickness, rate, and substrate temperature minimizes blurring for high-resolution shadow mask techniques.
Area of Science:
- Materials Science
- Nanotechnology
- Surface Science
Background:
- Stencil lithography is a high-resolution shadow mask technique.
- Blurring, an increase in deposited structure size beyond the stencil aperture, is a key challenge.
- Blurring manifests as geometric enlargement and a surrounding material halo, potentially due to surface diffusion.
Purpose of the Study:
- To quantitatively analyze blurring in stencil lithography.
- To investigate the dependence of blurring on the stencil-substrate gap and deposition parameters.
Main Methods:
- Utilized dedicated stencils for controlled variation of the stencil-substrate gap.
- Performed quantitative analysis of deposited structure size and halo width.
- Varied deposition parameters including thickness, rate, and substrate temperature.
Main Results:
- A linear relationship was observed between the stencil-substrate gap and the enlargement of directly deposited structures.
- A 10-micrometer gap enlarged structures by approximately 50 nm under specific deposition conditions.
- The halo width ranged from 0.2 to 3 micrometers, influenced by gap size, aperture, and deposition parameters.
Conclusions:
- Stencil-substrate gap is a critical factor influencing blurring in stencil lithography.
- Optimizing deposition parameters such as thickness, rate, and temperature can effectively reduce blurring.
- Findings provide insights for improving resolution and precision in stencil lithography applications.

