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Updated: Jun 20, 2026

The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors
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The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors

Published on: May 24, 2020

Optimization of a thin-film multilayer design by use of the generalized simulated-annealing method

C P Chang, Y H Lee, S Y Wu

    Optics Letters
    |September 22, 2009
    PubMed
    Abstract

    No abstract available in PubMed .

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