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Updated: Jun 20, 2026

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
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Published on: April 1, 2017

A quantitative nanodiffraction system for ultrahigh vacuum scanning transmission electron microscopy

Gary G Hembree1, Christoph Koch, John C H Spence

  • 1Department of Physics and Astronomy, Arizona State University, Tempe, AZ 85287-1504, USA. hembree@asu.edu

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|September 24, 2009
PubMed
Summary

Electron nanodiffraction offers the strongest signal from the smallest volumes for materials science. Modifications to a scanning transmission electron microscope (STEM) enhance nanodiffraction and quantitative convergent beam electron diffraction (QCBED) performance.

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