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Sign of chi((3)) in polysilane polymers
Optics Letters
|September 24, 2009
Summary
The third-order optical nonlinear susceptibility (chi((3))) of polysilane was measured using Z-scan. Polysilane exhibits negative chi((3)) at 532 nm due to two-photon absorption and positive chi((3)) at 1064 nm from bound-electronic processes.
Area of Science:
- Nonlinear optics
- Materials science
- Polymer chemistry
Background:
- Polysilanes are known for their unique electronic and optical properties.
- Understanding their nonlinear optical (NLO) behavior is crucial for applications in photonics and optoelectronics.
- Third-order nonlinear susceptibility (chi((3))) quantifies a material's response to intense light.
Purpose of the Study:
- To determine the sign and origin of the third-order optical nonlinear susceptibility (chi((3))) in polysilane.
- To investigate the wavelength-dependent NLO response of polysilane.
- To elucidate the underlying physical mechanisms contributing to the observed nonlinearities.
Main Methods:
- Single-beam Z-scan technique was employed to measure the nonlinear optical properties.
- Measurements were conducted at two distinct wavelengths: 532 nm (green) and 1064 nm (infrared).
- Analysis focused on determining the sign and magnitude of chi((3)).
Main Results:
- The third-order nonlinear susceptibility (chi((3))) of polysilane was found to be negative at 532 nm.
- At 1064 nm, polysilane exhibited a small and positive chi((3)).
- The negative chi((3)) at 532 nm was attributed to two-photon absorption resonance, while the positive chi((3)) at 1064 nm originated from bound-electronic processes.
Conclusions:
- Polysilane displays distinct nonlinear optical responses at different wavelengths.
- The sign change in chi((3)) is linked to specific optical phenomena like two-photon absorption.
- These findings provide valuable insights for designing polysilane-based NLO materials and devices.

