Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Studying the Cytoskeleton01:17

Studying the Cytoskeleton

The cytoskeletal architecture can be studied using different microscopic and biochemical techniques. Electron microscopy was instrumental in discovering the cytoskeletal architecture around the 1960s, which allowed obtaining structural information at a high-resolution level. However, the sample preparation procedure often limits this ability in biological samples. Several protocols have been developed over the years to optimize sample preparation. In one of the protocols known as rotary...
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Electron Behavior01:09

Electron Behavior

Electrons are negatively charged subatomic particles attracted to and orbit around the positively-charged nucleus of an atom. They reside in spaces associated with energy levels called shells and are further organized into subshells and orbitals within each shell.
Electrons Orbit the Nucleus
Electrons are found in specific locations outside of the nucleus. The shell in which an electron resides indicates the general energy level of the electron: those closer to the nucleus have less energy,...
Electron Behavior00:54

Electron Behavior

Electrons are negatively charged subatomic particles that are attracted to an orbit around the positively-charged nucleus of an atom. They reside in locations that are associated with energy levels called shells and are further organized into sub-shells and orbitals within each shell.Electrons Orbit the NucleusElectrons are found in specific locations outside of the nucleus. The shell in which an electron resides indicates the general energy level of the electron: those closer to the nucleus...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Akira Tonomura (1942-2012).

Nature·2012
Same author

Photon-assisted electron energy loss spectroscopy and ultrafast imaging.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2009
See all related articles

Related Experiment Video

Updated: Jun 20, 2026

Quantifying Cytoskeleton Dynamics Using Differential Dynamic Microscopy
06:37

Quantifying Cytoskeleton Dynamics Using Differential Dynamic Microscopy

Published on: June 15, 2022

Static and dynamic charges: changing perspectives and aims in electron microscopy.

Archie Howie1

  • 1Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge CB3 0HE, UK. ah30@aphys.cam.ac.uk

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|September 29, 2009
PubMed
Summary

Electron microscopists are reassessing charging effects. This study surveys methods for mapping internal charge distributions in materials like semiconductors and insulators.

More Related Videos

Studying Dynamic Processes of Nano-sized Objects in Liquid using Scanning Transmission Electron Microscopy
10:29

Studying Dynamic Processes of Nano-sized Objects in Liquid using Scanning Transmission Electron Microscopy

Published on: February 5, 2017

Scanning-probe Single-electron Capacitance Spectroscopy
10:53

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

Related Experiment Videos

Last Updated: Jun 20, 2026

Quantifying Cytoskeleton Dynamics Using Differential Dynamic Microscopy
06:37

Quantifying Cytoskeleton Dynamics Using Differential Dynamic Microscopy

Published on: June 15, 2022

Studying Dynamic Processes of Nano-sized Objects in Liquid using Scanning Transmission Electron Microscopy
10:29

Studying Dynamic Processes of Nano-sized Objects in Liquid using Scanning Transmission Electron Microscopy

Published on: February 5, 2017

Scanning-probe Single-electron Capacitance Spectroscopy
10:53

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

Area of Science:

  • Materials Science
  • Physics
  • Chemistry

Background:

  • Charging effects are a critical consideration in electron microscopy.
  • Understanding these effects is essential for accurate material analysis.

Purpose of the Study:

  • To survey basic aspects of charging phenomena in electron microscopy.
  • To discuss methods for mapping internal charge distributions.

Main Methods:

  • Review of established and emerging techniques for analyzing charging effects.
  • Discussion of charge mapping methodologies relevant to semiconductors and insulators.

Main Results:

  • Survey of charging phenomena and their impact on electron microscopy.
  • Detailed discussion of methods for mapping doping levels, trap distributions, and electric fields.

Conclusions:

  • Electron microscopists' perspectives on charging effects are evolving.
  • Effective mapping of internal charge distributions is crucial for advanced material characterization.