Scanning Electron Microscopy
Preparation of Samples for Electron Microscopy
Electrospray Ionization (ESI) Mass Spectrometry
Electrogravimetric Analysis: Overview
Atomic Emission Spectroscopy: Overview
Atomic Emission Spectroscopy: Lab
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Jun 20, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
Robert A Carlton1, Charles E Lyman, James E Roberts
1Rhone-Poulenc Rorer, Collegeville, PA 19426, USA. robert.a.carlton@gsk.com
Accurate quantitative chemical analysis using energy-dispersive X-ray spectrometry (EDS) in environmental scanning electron microscopes (ESEM) is now possible. A new charge neutralization method significantly reduces errors caused by electron beam scattering in ESEM.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: