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Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Preparation of Samples for Electron Microscopy01:20

Preparation of Samples for Electron Microscopy

To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...
Electrospray Ionization (ESI) Mass Spectrometry01:12

Electrospray Ionization (ESI) Mass Spectrometry

Higher molecular weight biomolecules are nonvolatile compounds that may decompose before ionizing or vaporizing during mass analysis with conventional electron impact ionization methods. Accordingly, electrospray ionization (ESI) is the favored method for vaporizing and ionizing biomolecules as it circumvents rapid fragmentation and enables the recording of mass signals for the entire biomolecule.
ESI utilizes electrical energy to transfer ions from the liquid phase of the sample into the...
Electrogravimetric Analysis: Overview01:30

Electrogravimetric Analysis: Overview

Electrogravimetric analysis measures the weight of an analyte deposited electrolytically onto a suitable working electrode. This method involves applying a potential to a pre-weighed electrode submerged in a solution, which results in the desired substance being deposited through reduction at the cathode or oxidation at the anode. The electrode's weight is recorded after deposition, and the difference in weight gives the analyte's weight in the solution.
To test the completeness of the...
Atomic Emission Spectroscopy: Overview01:20

Atomic Emission Spectroscopy: Overview

Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
Atomic Emission Spectroscopy: Lab01:29

Atomic Emission Spectroscopy: Lab

AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...

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Related Experiment Video

Updated: Jun 20, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Charge neutralization in the ESEM for quantitative X-ray microanalysis.

Robert A Carlton1, Charles E Lyman, James E Roberts

  • 1Rhone-Poulenc Rorer, Collegeville, PA 19426, USA. robert.a.carlton@gsk.com

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|September 29, 2009
PubMed
Summary
This summary is machine-generated.

Accurate quantitative chemical analysis using energy-dispersive X-ray spectrometry (EDS) in environmental scanning electron microscopes (ESEM) is now possible. A new charge neutralization method significantly reduces errors caused by electron beam scattering in ESEM.

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Microscopy

Background:

  • Quantitative chemical analysis using energy-dispersive X-ray spectrometry (EDS) in environmental scanning electron microscopes (ESEM) is challenging.
  • Electron beam scattering by chamber gas and surface charging effects introduce significant errors (15-20%) in traditional ESEM-EDS analysis.

Purpose of the Study:

  • To develop and validate a novel surface charge neutralization scheme for ESEM-EDS.
  • To improve the accuracy and precision of quantitative chemical analysis in ESEM.

Main Methods:

  • Implementation of a surface charge neutralization scheme requiring an independent path to ground.
  • Adjustment of Gaseous Secondary Electron Detector voltage to maintain zero current through the ground path at 1-2 torr gas pressure.
  • Validation using National Institute of Standards and Technology (NIST) Standard Reference Material 482 (copper-gold alloys).

Main Results:

  • The new charge neutralization scheme successfully reduced quantitative analysis errors to +/- 5% relative error, comparable to traditional EDS.
  • Demonstrated accuracy and precision of the method through analysis of certified copper-gold alloys.
  • The procedure effectively neutralizes negative surface charge by forming positive ions from chamber gas.

Conclusions:

  • A reliable method for surface charge neutralization in ESEM-EDS has been established.
  • This technique enables accurate quantitative chemical analysis in ESEM, overcoming previous limitations.
  • The validated method significantly enhances the utility of ESEM for materials characterization.