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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

Overview of Microscopy Techniques

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

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Related Experiment Video

Updated: Jun 19, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on: June 13, 2023

Large scan area high-speed atomic force microscopy using a resonant scanner.

B Zhao¹, J P Howard-Knight, A D L Humphris

¹Department of Physics and Astronomy, University of Sheffield, Hounsfield Road, Sheffield S3 7RH, United Kingdom.

The Review of Scientific Instruments

|October 2, 2009

Summary

This summary is machine-generated.

A novel atomic force microscopy scan stage utilizes quartz bar resonance for high-speed, large-area imaging. This technology enables rapid, linearized visualization of samples in both air and liquid, including living bacteria.

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Last Updated: Jun 19, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

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Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Area of Science:

Nanotechnology and Advanced Materials
Surface Science and Imaging

Background:

Atomic Force Microscopy (AFM) is crucial for nanoscale imaging but often limited by scan speed and area.
Existing AFM scan stages face challenges in achieving both high speed and large scan areas, particularly in diverse environments.

Purpose of the Study:

To develop and demonstrate a high-speed scan stage for AFM.
To enable large scan area imaging with high linearity in both air and liquid.
To showcase the scanner's capability with various sample types and environments.

Main Methods:

Construction of a scan stage based on the resonant oscillation of a quartz bar.
Utilizing the well-defined time-position response inherent to resonant systems.
Testing the scanner's performance for imaging topographic silicon samples, polymers, and bacteria in air and liquid.

Main Results:

Achieved a large scan area of up to 37.5 µm.
Enabled high-speed imaging, completing scans in as little as 0.7 seconds.
Obtained highly linearized images, demonstrating effective performance in both air and liquid, including imaging of Staphylococcus aureus.

Conclusions:

The quartz bar resonant scan stage offers a significant advancement for high-speed, large-area AFM imaging.
The system's versatility allows for effective imaging in both gaseous and liquid media.
This technology facilitates rapid nanoscale analysis of diverse materials and biological samples.