You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Jun 19, 2026

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
A Snigirev1, I Snigireva, V Kohn
1ESRF, B.P. 220, 38043 Grenoble, France.
A new x-ray interferometer uses a bilens system to create overlapping coherent beams, generating interference patterns for nanoscale material analysis. This method enables detailed characterization of x-ray coherence and nanoscale structures.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: