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Related Concept Videos

Graphical and Analytic Representation of Sinusoids01:20

Graphical and Analytic Representation of Sinusoids

Analyzing two sinusoidal voltages with equal amplitude and period but different phases on an oscilloscope, an instrument used to display and analyze waveforms, involves a three-step process.
The first step is measuring the peak-to-peak value, which is twice the amplitude of the sinusoid. This provides information about the maximum voltage swing of the waveform.
Secondly, the period and angular frequency are determined. The period is the time taken for one complete cycle of the waveform, while...
Distribution of Stresses in a Narrow Rectangular Beam01:11

Distribution of Stresses in a Narrow Rectangular Beam

In studying beam stress distribution, examining an elemental section is essential. To determine the average shearing stress on this face, the calculated shear is divided by the surface area. Importantly, shearing stresses on the beam's transverse and horizontal planes mirror each other, indicating a consistent stress distribution along the upper region of the beam. Notably, shearing stresses are absent at the beam's upper and lower surfaces due to the absence of applied forces in these areas.
Full wave rectifier01:22

Full wave rectifier

A full-wave rectifier is a device that converts alternating current (AC) to direct current (DC) and is more efficient than its half-wave counterpart. It typically includes a center-tapped transformer, two diodes, and a load resistor. The secondary winding of the transformer is divided to provide two equal voltages of opposite polarities, which is the pivotal element of full-wave rectification.
Gauss's Law01:07

Gauss's Law

If a closed surface does not have any charge inside where an electric field line can terminate, then the electric field line entering the surface at one point must necessarily exit at some other point of the surface. Therefore, if a closed surface does not have any charges inside the enclosed volume, then the electric flux through the surface is zero. What happens to the electric flux if there are some charges inside the enclosed volume? Gauss's law gives a quantitative answer to this question.

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Generalization of the Ronchi, sinusoidal, and triangular rulings for Gaussian-laser-beam-diameter measurements.

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Related Experiment Video

Updated: Jun 19, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
10:39

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

Published on: October 11, 2016

Full-wave rectified sinusoidal ruling for measuring Gaussian beam diameters.

A K Cherri

    Optics Letters
    |October 2, 2009
    PubMed
    Summary

    A new full-wave rectified sinusoidal grating accurately measures Gaussian laser beam diameters of all sizes. This novel grating outperforms traditional Ronchi, triangular, and sinusoidal rulings for precise laser beam analysis.

    Area of Science:

    • Optics and Photonics
    • Laser Metrology

    Background:

    • Accurate measurement of Gaussian laser beam diameter is crucial for various optical applications.
    • Existing methods using Ronchi, triangular, and sinusoidal rulings have limitations in accuracy and range.

    Purpose of the Study:

    • To introduce and evaluate a novel full-wave rectified sinusoidal grating for Gaussian laser beam diameter measurement.
    • To demonstrate the superiority of the proposed grating over conventional rulings.

    Main Methods:

    • Development of a novel full-wave rectified sinusoidal grating.
    • Experimental validation of the grating's performance in measuring Gaussian laser beam diameters.
    • Comparative analysis against Ronchi, triangular, and sinusoidal rulings.

    Main Results:

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    The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry
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    Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
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    Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

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    Related Experiment Videos

    Last Updated: Jun 19, 2026

    Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
    10:39

    Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

    Published on: October 11, 2016

    The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry
    12:14

    The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

    Published on: August 12, 2013

    Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
    05:57

    Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

    Published on: April 1, 2020

    • The proposed grating provides accurate measurements for both small and large Gaussian beam diameters.
    • The novel grating demonstrates superior performance compared to Ronchi, triangular, and sinusoidal rulings.
    • High precision in laser beam diameter determination was achieved.

    Conclusions:

    • The full-wave rectified sinusoidal grating is an effective and superior tool for measuring Gaussian laser beam diameters.
    • This innovation offers enhanced accuracy and reliability in laser metrology.
    • The proposed grating represents a significant advancement in optical measurement techniques.