Related Experiment Video
Updated: Jun 19, 2026

Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities
Published on: November 30, 2012
Focusing properties of hard x-ray photon sieves: three-parameter apodization window and waveguide effect
Changqing Xie1, Xiaoli Zhu, Jia Jia
1Key Laboratory of Nano-Fabrication and Novel Devices Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China. xiechangqing@ime.ac.cn
Abstract:
In this Letter, a three-parameter modified Kaiser apodization window is used to modulate the pinhole density on each ring of hard x-ray photon sieves, analyzing the guided-wave propagation inside the photon sieves' nanostructure. Theoretical analysis reveals that the waveguide effect can suppress the emergence of the high-order diffraction effect; the additional parameter of the modified Kaiser window function gives rise to new degrees of freedom for manipulating the FWHM and signal-to-noise ratio. Metal nanostructure thickness has no influence on the FWHM. Hard x-ray photon sieves with 90 degrees phase shift (not 180 degrees phase shift) can provide the best signal-to-noise ratio, which relaxes the nanofabrication constraints somewhat. Our work provides a robust way to design hard x-ray photon sieves.
Related Concept Videos
X-ray Crystallography
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
Interference and Diffraction
Determination of Crystal Structures
The de Broglie Wavelength

