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Mapping the nonlinear optical susceptibility by noncollinear second-harmonic generation.

M C Larciprete¹, F A Bovino, M Giardina

¹Dipartimento di Energetica-Università di Roma La Sapienza, Roma, Italy. mariacristina.larciprete@uniroma1.it

|October 14, 2009

Summary

This study introduces a new method using noncollinear second-harmonic generation to measure nonlinear optical susceptibility. It simplifies material characterization by avoiding sample rotation, crucial for sensitive samples.

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Area of Science:

Nonlinear optics
Materials science
Solid-state physics

Background:

Nonlinear optical susceptibility is crucial for understanding light-matter interactions.
Accurate determination of nonlinear optical properties is essential for optical device development.
Existing methods for measuring nonlinear optical susceptibility can be complex and time-consuming.

Purpose of the Study:

To present a novel, efficient method for evaluating nonlinear optical susceptibility.
To enable verification of Kleinman's symmetry rules for materials.
To provide a way to retrieve absolute values of nonlinear optical tensor terms.

Main Methods:

Utilizing noncollinear second-harmonic generation.
Analyzing generated signal by varying polarization of fundamental beams at a fixed incidence angle.
Developing polarization charts for data interpretation.

Main Results:

The method successfully evaluates nonzero elements of nonlinear optical susceptibility.
Demonstrated ability to verify Kleinman's symmetry rules.
Successfully retrieved absolute values of nonlinear optical tensor terms from reference measurements.
Experimental validation using gallium nitride (GaN) layers.

Conclusions:

The proposed method offers a simplified and efficient approach to nonlinear optical characterization.
It is particularly advantageous for samples where angular scans are problematic.
This technique facilitates accurate material property assessment for optical applications.