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Single layer growth of sub-micron metal-organic framework crystals observed by in situ atomic force microscopy

Neena S John1, Camilla Scherb, Maryiam Shöâeè

  • 1School of Chemistry, The University of Manchester, Brunswick Street, Manchester, UK M13 9PL.

Chemical Communications (Cambridge, England)
|October 15, 2009
PubMed

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...