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Updated: Jun 19, 2026

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Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
Published on: May 23, 2017
Electronic speckle pattern interferometry for simultaneous measurement of out-of-plane displacement and slope
Optics Letters
|October 16, 2009
Abstract:
An optical configuration is presented for simultaneous measurement of out-of-plane displacement and slope change in electronic speckle pattern interferometry. Experimental results for a rectangular plate clamped along the edges and loaded at the center are presented.

