Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

2.8K
Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
2.8K
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

12.8K
The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
12.8K
Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

12.1K
Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been...
12.1K
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

5.2K
A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
5.2K
Cryo-electron Microscopy01:28

Cryo-electron Microscopy

4.1K
Conventional electron microscopy (EM) involves dehydration, fixation, and staining of biological samples, which distorts the native state of biological molecules and results in several artifacts. Also, the high-energy electron beam damages the sample and makes it difficult to obtain high-resolution images. These issues can be addressed using cryo-EM, which uses frozen samples and gentler electron beams. The technique was developed by Jacques Dubochet, Joachim Frank, and Richard Henderson, for...
4.1K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Sequential Tilting 4D-STEM for Improved Momentum-Resolved STEM Field Mapping.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2025
Same author

Transmission electron microscopy analysis of UV laser implanted gold nanoparticles and their influence on photoluminescence enhancement from silicon nanocrystals.

Discover nano·2025
Same author

Three dimensional classification of dislocations from single projections.

Nature communications·2024
Same author

Feasibility Study on the Generation of Nanoporous Metal Structures by Means of Selective Alloy Depletion in Halogen-Rich Atmospheres.

Materials (Basel, Switzerland)·2024
Same author

Composition and electronic structure of [Formula: see text]/[Formula: see text]/Al passivating carrier selective contacts on n-type silicon solar cells.

Scientific reports·2023
Same author

<sup>99m</sup>Tc-HDP Labeling-A Non-Destructive Method for Real-Time Surveillance of the Osteogenic Differentiation Potential of hMSC during Ongoing Cell Cultures.

International journal of molecular sciences·2022
Same journal

Polyalthia Longifolia Induced Apoptosis via miR-484 Downregulation: A Multimodal In Situ Microscopy, In Vitro, and In Vivo Investigation.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2026
Same journal

Rhythmic Pattern of the Ovarian Development in Posthatching Japanese Quail (Coturnix coturnix japonica): Histological, Ultrastructural, and Immunohistochemical Study.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2026
Same journal

Postnatal Developmental Expression and Localization of Water Channel Proteins in the Rat Ovary.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2026
Same journal

Novel Hybrid Semiconductor-Cellular Standard for 3D FIB-SEM Nanotomography Analysis.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2026
Same journal

Morpho-Anatomical Characterization of the Raisin Tree, Hovenia dulcis Thunb., Utilizing Optical Light and Scanning Electron Microscopy With Energy Dispersive X-Ray Spectroscopy.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2026
Same journal

Comparative Aspects of the Hemipenial Architecture of the Arabian Horned Viper Cerastes gasperettii: Macroscopic and Microscopic Analysis With Evolutionary Perspectives.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2026
See all related articles

Related Experiment Video

Updated: Dec 31, 2025

Single Particle Cryo-Electron Microscopy: From Sample to Structure
11:52

Single Particle Cryo-Electron Microscopy: From Sample to Structure

Published on: May 29, 2021

9.4K

Pattern recognition in high-resolution electron microscopy of complex materials.

Tore Niermann1, Karsten Thiel, Michael Seibt

  • 1Physikalisches Institut der Universität Göttingen, Friedrich-Hund-Platz 1, D-37077 Göttingen, Germany. niermann@ph4.physik.uni-goettingen.de

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|October 17, 2009
PubMed
Summary
This summary is machine-generated.

This study introduces a pattern recognition method to analyze local image patterns in complex materials. This technique effectively identifies microstructural properties in defective layers and devices.

More Related Videos

Multimodal Hierarchical Imaging of Serial Sections for Finding Specific Cellular Targets within Large Volumes
11:19

Multimodal Hierarchical Imaging of Serial Sections for Finding Specific Cellular Targets within Large Volumes

Published on: March 20, 2018

10.8K
Optimized Negative Staining: a High-throughput Protocol for Examining Small and Asymmetric Protein Structure by Electron Microscopy
09:37

Optimized Negative Staining: a High-throughput Protocol for Examining Small and Asymmetric Protein Structure by Electron Microscopy

Published on: August 15, 2014

44.7K

Related Experiment Videos

Last Updated: Dec 31, 2025

Single Particle Cryo-Electron Microscopy: From Sample to Structure
11:52

Single Particle Cryo-Electron Microscopy: From Sample to Structure

Published on: May 29, 2021

9.4K
Multimodal Hierarchical Imaging of Serial Sections for Finding Specific Cellular Targets within Large Volumes
11:19

Multimodal Hierarchical Imaging of Serial Sections for Finding Specific Cellular Targets within Large Volumes

Published on: March 20, 2018

10.8K
Optimized Negative Staining: a High-throughput Protocol for Examining Small and Asymmetric Protein Structure by Electron Microscopy
09:37

Optimized Negative Staining: a High-throughput Protocol for Examining Small and Asymmetric Protein Structure by Electron Microscopy

Published on: August 15, 2014

44.7K

Area of Science:

  • Materials Science
  • Crystallography
  • Image Analysis

Background:

  • Crystals and amorphous materials exhibit unique local patterns in electron microscopy images due to structural features like defects and heterointerfaces.
  • Existing pattern recognition methods have been applied to analyze compositional changes in isostructural heterostructures by examining patterns within unit cells.

Purpose of the Study:

  • To extend pattern recognition analyses to more complex materials by examining patterns in localized image regions.
  • To develop a method for identifying typical patterns in high-resolution electron micrographs for microstructural investigation.

Main Methods:

  • Examining patterns in small circular areas centered on intensity maxima within high-resolution electron micrographs.
  • Applying nonsupervised clustering, specifically Ward's clustering method, to categorize these localized image patterns.

Main Results:

  • Successfully identified typical patterns in a highly defective Zinc Manganese Telluride (ZnMnTe) layer on Gallium Arsenide (GaAs).
  • Demonstrated the method's efficacy in analyzing patterns within a tunnel magnetoresistance device.
  • Showcased how identified patterns correlate with specific microstructural properties.

Conclusions:

  • Nonsupervised clustering of localized image patterns is a powerful approach for microstructural characterization of complex materials.
  • The developed method facilitates further investigation into the properties of defective layers and advanced electronic devices.
  • This technique offers a novel way to interpret complex data from high-resolution electron microscopy.