Related Experiment Video

Updated: Jun 19, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Early results from an aberration-corrected JEOL 2200FS STEM/TEM at Oak Ridge National Laboratory

Douglas A Blom1, Lawrence E Allard, Satoshi Mishina

  • 1Oak Ridge National Laboratory, Materials Science & Technology Division, 1 Bethel Valley Road, Oak Ridge, TN 37831-6064, USA. blomda@ornl.gov

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|October 17, 2009
PubMed

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