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Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Preparation of Samples for Electron Microscopy01:20

Preparation of Samples for Electron Microscopy

To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

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Related Experiment Video

Updated: Jun 19, 2026

Experimental Methods for Spin- and Angle-Resolved Photoemission Spectroscopy Combined with Polarization-Variable Laser
09:00

Experimental Methods for Spin- and Angle-Resolved Photoemission Spectroscopy Combined with Polarization-Variable Laser

Published on: June 28, 2018

High-resolution spin-polarized scanning electron microscopy (spin SEM).

Teruo Kohashi1, Makoto Konoto, Kazuyuki Koike

  • 1Joint Research Center for Atom Technology (JRCAT), Angstrom Technology Partnership (ATP), 1-1-1 Higashi, Tsukuba 305-0046, Japan. teruo.kohashi.fc@hitachi.com

Journal of Electron Microscopy
|October 21, 2009
PubMed
Summary
This summary is machine-generated.

We developed spin-polarized scanning electron microscopy (spin SEM) with 5-nm resolution. This advancement allows for clear imaging and precise analysis of magnetic recording media at the nanoscale.

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Area of Science:

  • Materials Science
  • Physics
  • Nanotechnology

Background:

  • Spin-polarized scanning electron microscopy (spin SEM) is crucial for analyzing magnetic materials.
  • Efficient collection of secondary electrons is vital for spin SEM due to low polarimeter efficiency.

Purpose of the Study:

  • To develop and optimize secondary electron optics for high-resolution spin SEM.
  • To enhance signal-to-noise ratios and imaging clarity in spin SEM.

Main Methods:

  • Designed secondary electron optics using 3D simulation of electron trajectories.
  • Integrated the optics into an ultra-high vacuum (UHV) spin SEM chamber with a Schottky-type electron gun.
  • Utilized the system to image recorded bits on a perpendicular magnetic recording medium.

Main Results:

  • Achieved a spatial resolution of 5 nm.
  • Enabled highly efficient collection and transport of secondary electrons.
  • Visualized fine details in bit shapes and the smallest magnetic domains.

Conclusions:

  • The developed secondary electron optics significantly enhances spin SEM capabilities.
  • The 5-nm resolution enables detailed nanoscale analysis of magnetic recording media.
  • This technology provides high-quality imaging and precise probe beam control.