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Updated: Jun 19, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

System for direct measurement of the step response of electronic devices on the picosecond time scale

J A Sheridan, D M Bloom, P M Solomon

    Optics Letters
    |October 28, 2009
    PubMed

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