Ultrashort optical waveform measurements using frequency-resolved optical gating

We measure the intensity and phase of ultrashort pulses from a self-mode-locked Ti:sapphire laser using the recently developed technique of frequency-resolved optical gating. These results represent to our knowledge the shortest complete optical waveform characterization measurements performed to date. We also verify recent theoretical calculations that predict that the main limitation on the pulse duration from these lasers is the presence of uncompensated higher-order dispersion.