Characterization of planar antiresonant reflecting optical waveguide structures on silicon by an Abbe refractometer

A method is reported for characterizing planar antiresonant reflecting optical waveguides (ARROW's) by use of an unmodified Abbe refractometer. The technique permits the simultaneous determination of the TE-mode effective indices of the allowable modes, the thickness and refractive index of the waveguide core. Results from experimental measurements of an ARROW waveguide compare well with those predicted by a f ield transfer matrix analysis.