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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Published on: April 1, 2020

Large angular dispersion by a virtually imaged phased array and its application to a wavelength demultiplexer

M Shirasaki

    Optics Letters
    |October 30, 2009
    PubMed

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