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Updated: Jun 19, 2026

Implementation of a Reference Interferometer for Nanodetection

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Published on: April 26, 2014

Folded Jamin interferometer: a stable instrument for refractive-index measurements.

H Moosmüller, W P Arnott

|October 30, 2009

Summary

A new two-beam interferometer measures refractive index changes with high stability. This compact device uses minimal optical elements, making it robust against movement for precise optical measurements.

Area of Science:

Optics and Photonics
Interferometry
Optical Measurement

Background:

Refractive index measurement is crucial in various scientific and industrial applications.
Existing interferometers can be sensitive to environmental disturbances and mechanical instability.
A need exists for robust and simplified interferometric systems for precise optical property determination.

Purpose of the Study:

To introduce a novel two-beam interferometer design for measuring refractive index and its variations.
To develop an interferometer with enhanced stability and reduced sensitivity to optical element movement.
To demonstrate a compact and practical system for optical metrology.

Main Methods:

Design and construction of a two-beam interferometer utilizing only two optical elements.

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Implementation of a polarized, folded Jamin interferometer configuration.

Development of a laboratory prototype for performance evaluation.

Main Results:

The developed interferometer demonstrates high insensitivity to the movement of its optical components.
A functional laboratory prototype was successfully built and tested.
The design facilitates convenient phase adjustment for accurate measurements.

Conclusions:

The novel two-beam interferometer offers a stable and simplified approach for refractive index measurements.
Its robustness against mechanical disturbances makes it suitable for demanding optical sensing applications.
This compact interferometric system represents a significant advancement in optical metrology.