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Polarization interferometer for measuring the flying height of magnetic read-write heads
Optics Letters
|October 30, 2009
Summary
A new optical flying-height tester analyzes complex reflectivity, offering greater accuracy and repeatability for read-write sliders. This advanced method also measures slider material
Area of Science:
- Optical Metrology
- Materials Science
- Nanotechnology
Background:
- Traditional flying-height testers rely on limited normal-incidence reflectivity.
- Existing methods lack precision at zero flying height and require separate material characterization.
Purpose of the Study:
- To develop an advanced optical flying-height tester.
- To enhance accuracy, repeatability, and in situ material property measurement.
Main Methods:
- Utilizing complex amplitude reflectivity analysis.
- Incorporating polarization-dependent complex phase measurements.
- Developing an integrated system for flying height and refractive index determination.
Main Results:
- The new tester provides superior accuracy and repeatability.
- Precision is maintained even at zero flying height.
- In situ measurement of the complex index of refraction for slider material is achieved.
Conclusions:
- The proposed optical tester offers a significant advancement in disk drive technology metrology.
- This integrated approach simplifies the measurement process and improves data reliability.
- The technology enables more precise characterization of read-write slider interfaces.
