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Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
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Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

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Near-infrared free-carrier absorption in silicon nanocrystals

Rohan D Kekatpure1, Mark L Brongersma

  • 1Geballe Laboratory for Advanced Materials, 476 Lomita Mall, Stanford, California 94305, USA.

Optics Letters
|November 3, 2009
PubMed

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