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Related Concept Videos

Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.
Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.

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A Multimodal Wide-Field Fourier-Transform Raman Microscope
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Published on: December 30, 2025

Ultrafast dark-field interferometric microscopic reflectometry.

I Zeylikovich, R R Alfano

    Optics Letters
    |November 3, 2009
    PubMed
    Summary
    This summary is machine-generated.

    Researchers developed ultrafast dark-field correlation interferometry for microscopic objects. This new technique achieves rapid, high-sensitivity measurements, demonstrated by precisely determining fiber cladding thickness.

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    Area of Science:

    • Optics and Photonics
    • Microscopy
    • Metrology

    Background:

    • Traditional interferometry methods face limitations in speed and sensitivity for microscopic reflective objects.
    • Ultrafast optical techniques are crucial for capturing dynamic processes in materials science.

    Purpose of the Study:

    • To introduce and validate a novel ultrafast dark-field correlation interferometry method.
    • To assess the performance metrics including speed, dynamic range, sensitivity, and resolution.

    Main Methods:

    • Implementation of a 120-femtosecond (fs) single-shot registration system.
    • Utilizing dark-field interferometry principles for enhanced contrast and signal isolation.
    • Application to reflective microscopic samples.

    Main Results:

    • Achieved a dynamic range exceeding 35 dB.
    • Demonstrated a sensitivity below -50 dB.
    • Obtained a spatial resolution of 15 micrometers.
    • Successfully measured single-mode fiber cladding thickness at 19 micrometers.

    Conclusions:

    • The developed ultrafast dark-field correlation interferometry is a powerful tool for high-precision microscopic measurements.
    • The method offers significant advantages in speed and sensitivity over existing techniques.
    • Validated potential for applications in material characterization and nanotechnology.