Updated: May 20, 2026

Analysis of Contact Interfaces for Single GaN Nanowire Devices
Published on: November 16, 2013
1Institute for Surface and Thin Film Analysis IFOS, Technical University of Kaiserslautern, D-67663 Kaiserslautern, Germany.
This study reviews surface analysis techniques like electron spectroscopy and mass spectrometry for characterizing nanostructures. Secondary Neutral Mass Spectrometry is highlighted for its depth resolution in analyzing thin films.
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