Electron Microscope Tomography and Single-particle Reconstruction
Overview of Electron Microscopy
Super-resolution Fluorescence Microscopy
X-ray Crystallography
Transmission Electron Microscopy
Determination of Crystal Structures
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Updated: Jun 18, 2026

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
Published on: April 1, 2017
Osamu Kamimura1, Takashi Dobashi, Kota Kawahara
1Central Research Laboratory, Hitachi, Ltd., 1-280, Higashi-Koigakubo Kokubunji-shi, Tokyo 185-8601, Japan. osamu.kamimura.ae@hitachi.com
A novel electron diffraction microscope, built on a scanning electron microscope (SEM), achieves atomic-level imaging with minimal specimen damage. This breakthrough enables high-resolution structural analysis of materials like carbon nanotubes.
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