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Related Concept Videos

Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.
X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Determination of Crystal Structures01:29

Determination of Crystal Structures

In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...

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Related Experiment Video

Updated: Jun 18, 2026

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
09:13

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Published on: April 1, 2017

10-kV diffractive imaging using newly developed electron diffraction microscope.

Osamu Kamimura1, Takashi Dobashi, Kota Kawahara

  • 1Central Research Laboratory, Hitachi, Ltd., 1-280, Higashi-Koigakubo Kokubunji-shi, Tokyo 185-8601, Japan. osamu.kamimura.ae@hitachi.com

Ultramicroscopy
|November 21, 2009
PubMed
Summary

A novel electron diffraction microscope, built on a scanning electron microscope (SEM), achieves atomic-level imaging with minimal specimen damage. This breakthrough enables high-resolution structural analysis of materials like carbon nanotubes.

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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
10:12

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Related Experiment Videos

Last Updated: Jun 18, 2026

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
09:13

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Published on: April 1, 2017

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
10:12

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Area of Science:

  • Materials Science
  • Microscopy
  • Electron Diffraction

Background:

  • Conventional scanning electron microscopy (SEM) offers surface imaging but lacks atomic-level resolution.
  • Electron diffraction techniques provide high-resolution structural information but can damage delicate specimens.

Purpose of the Study:

  • To develop a new electron diffraction microscope integrated with SEM.
  • To achieve atomic-level resolution imaging with minimal specimen damage.
  • To enable seamless transition between SEM observation and high-resolution diffraction imaging.

Main Methods:

  • Modification of a conventional scanning electron microscope (SEM) for electron diffraction.
  • Utilizing low-voltage electron beams (10 kV) for imaging.
  • Application of iterative phase retrieval algorithms.
  • Reconstruction of material structures from diffraction patterns.

Main Results:

  • Development of a hybrid SEM-based electron diffraction microscope.
  • Successful atomic-level resolution imaging (0.34-nm spacing) of a multi-wall carbon nanotube.
  • Demonstration of low-voltage diffractive imaging capabilities.
  • Validation of iterative phase retrieval for structural reconstruction.

Conclusions:

  • The developed microscope bridges the gap between SEM observation and high-resolution electron diffraction.
  • This technique allows for detailed structural analysis of sensitive materials without significant damage.
  • It opens new possibilities for nanoscale material characterization.