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Updated: Jun 18, 2026

Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization
Published on: September 8, 2023
Matthieu Dubreuil1, Sylvain Rivet, Bernard Le Jeune
1Université Européenne de Bretagne, 5 bd Laënnec, 35000 Rennes, France. matthieu.dubreuil@univ-brest.fr
A novel snapshot Mueller matrix polarimeter (SMMP) uses a Wollaston prism for simultaneous dual-beam spectral analysis. This method enhances real-time measurement accuracy by reducing noise and systematic errors.
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