Counting Synapses Using FIB/SEM Microscopy: A True Revolution for Ultrastructural Volume Reconstruction

Angel Merchán-Pérez1, José-Rodrigo Rodriguez, Lidia Alonso-Nanclares

  • 1Laboratorio de Circuitos Corticales, Centro de Tecnología Biomédica, Universidad Politécnica de Madrid Madrid, Spain.

Frontiers in Neuroanatomy
|December 2, 2009
PubMed
Summary

Focused ion beam milling and scanning electron microscopy (FIB/SEM) offers a faster, more accurate method for counting synapses in neuronal circuits. This 3D reconstruction technique surpasses traditional electron microscopy and stereology in speed and precision.