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Published on: December 3, 2013
Extending the depth of focus for enhanced three-dimensional imaging and profilometry: an overview
Alex Zlotnik1, Shai Ben-Yaish, Zeev Zalevsky
1School of Engineering, Bar-Ilan University, Ramat-Gan, 52900 Israel.
Applied Optics
|December 4, 2009
Abstract:
We overview the benefits that extended depth of focus technology may provide for three-dimensional imaging and profilometry. The approaches for which the extended depth of focus benefits are being examined include stereoscopy, light coherence, pattern projection, scanning line, speckles projection, and projection of axially varied shapes.
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