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A generalized reference-plane-based calibration method in optical triangular profilometry.

Suochao Cui1, Xiao Zhu

  • 1Institute of Optoelectronics Science and Engineering, Huazhong University of Science and Technology, 1037 Luoyu Road, Wuhan, 430074, China.

Optics Express
|December 10, 2009
PubMed
Summary
This summary is machine-generated.

A new calibration method for optical triangular profilometry is introduced. This technique establishes a linear relationship between height and phase shift for accurate 3D measurements.

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Area of Science:

  • Optics and Photonics
  • Metrology
  • Computer Vision

Background:

  • Optical triangular profilometry is a key technique for 3D surface measurement.
  • Accurate calibration is crucial for reliable profilometry results.
  • Existing methods may have limitations in flexibility regarding component placement.

Purpose of the Study:

  • To propose a generalized reference-plane-based calibration method for optical triangular profilometry.
  • To develop a flexible calibration approach accommodating arbitrary camera, projector, and plane orientations.
  • To establish a fundamental relationship for height reconstruction.

Main Methods:

  • Utilizing projection ray tracing and image ray tracing methods.
  • Employing the pin-hole camera model for camera and projector.
  • Modeling reference and test planes using parallel planes model.
  • Deriving a linear relationship between the reciprocal of height and phase shift.

Main Results:

  • Demonstrated a linear relationship between the reciprocal of height and the reciprocal of phase shift (or vertical pixel distance).
  • The proposed method allows for arbitrary positions and directions of camera, projector, and planes.
  • Experimental verification confirmed the effectiveness of the generalized calibration method.

Conclusions:

  • The generalized reference-plane-based calibration method offers enhanced flexibility for optical triangular profilometry.
  • The derived linear relationship simplifies height calculation and improves measurement accuracy.
  • This method provides a robust solution for 3D surface reconstruction in various configurations.