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Updated: Jun 17, 2026

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx

Published on: May 13, 2020

Investigation of resistive switching in Cu-doped HfO2 thin film for multilevel non-volatile memory applications

Yan Wang1, Qi Liu, Shibing Long

  • 1Laboratory of Nano-Fabrication and Novel Devices Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing, People's Republic of China.

Nanotechnology
|December 17, 2009
PubMed

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