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The Frequency Domain Thermoreflectance Technique for Thermal Property Measurements
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Phase-modulation method for AWG phase-error measurement in the frequency domain.

Kazumasa Takada1, Tomohiro Hirose

  • 1Department of Electronic Engineering, Faculty of Engineering, Gunma University, 1-5-1 Tenjin-cho,Kiryu 376-8515, Japan. takada@el.gunma-u.ac.jp

Optics Letters
|December 18, 2009
PubMed
Summary
This summary is machine-generated.

We developed a phase-modulation method to measure arrayed waveguide grating (AWG) phase errors. This technique achieves high accuracy, even without carrier frequencies, for precise optical device characterization.

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Area of Science:

  • Photonics and Optical Engineering
  • Integrated Optics
  • Waveguide Devices

Background:

  • Arrayed waveguide gratings (AWGs) are crucial components in optical communication systems.
  • Accurate measurement of phase errors in AWGs is essential for device performance.
  • Existing methods may have limitations in accuracy or require specific signal conditions.

Purpose of the Study:

  • To introduce a novel phase-modulation method for measuring AWG phase error.
  • To enhance the accuracy and applicability of AWG phase error measurements.
  • To address limitations of previous measurement techniques.

Main Methods:

  • Developed a phase-modulation technique for frequency-domain analysis.
  • Integrated the method with a previously reported digital sampling technique.
  • Performed measurements on arrayed waveguide gratings.

Main Results:

  • Achieved a measurement accuracy of +/-0.055 radians for phase error.
  • Successfully measured phase error in the center 90% of waveguides.
  • Demonstrated effectiveness even when no carrier frequencies are present in the interferometer's beat signal.

Conclusions:

  • The proposed phase-modulation method offers a highly accurate approach for AWG phase error measurement.
  • This technique is robust and applicable under conditions where carrier frequencies are absent.
  • The findings contribute to improved characterization and design of AWG devices.