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Updated: Jun 17, 2026

06:56
Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
Published on: May 23, 2017
Surface-deformation measurement using the wavefront reconstruction technique.
1Willow Run Laboratories, Institute of Science and Technology, The University of Michigan, Ann Arbor, Michigan, USA.
Applied Optics
|January 6, 2010
Summary
This study introduces a novel method for measuring tiny deformations in 3D objects using wavefront reconstruction and interferometry. The technique accurately quantifies object movement under stress, validated by experimental results.
Area of Science:
- Optical Engineering
- Metrology
- Applied Physics
Background:
- Measuring minute deformations in 3D objects is crucial for understanding material behavior under stress.
- Existing methods may have limitations in accuracy or applicability to arbitrary shapes.
- Wavefront reconstruction offers potential for advanced interferometric measurements.
Purpose of the Study:
- To present a new interferometric method for measuring small deformations in three-dimensional objects.
- To apply wavefront reconstruction techniques to diffuse reflecting surfaces.
- To develop a theoretical framework for interpreting interferometric data in terms of object displacement.
Main Methods:
- Application of wavefront reconstruction (Leith and Upatnieks) to interferometry.
- Interferometry of three-dimensional diffusely reflecting objects.
- Development of a detailed theory for interpreting interference patterns related to object motion.
Main Results:
- Successful measurement of minute deformations in arbitrary 3D objects.
- Experimental verification of the proposed wavefront reconstruction interferometry method.
- Validation of the theoretical interpretation of interference phenomena.
Conclusions:
- The developed method provides an accurate means for measuring small deformations in 3D objects.
- Wavefront reconstruction is effectively applied to interferometry of diffuse reflectors.
- The theoretical model accurately predicts object translations and rotations from interference data.

