Quantitative modeling of coupling-induced resonance frequency shift in microring resonators

Qing Li1, Mohammad Soltani, Amir H Atabaki

  • 1School of Electrical and Computer Engineering, Georgia Institute of Technology, 777 Atlantic Drive NW, Atlanta, GA 30332-0250, USA. qli6@gatech.edu

Optics Express
|January 7, 2010
PubMed
Summary

We studied coupling-induced resonance frequency shift (CIFS) in dielectric microring resonators. A new model, extending coupled mode theory, accurately predicts CIFS, enabling practical device design without complex simulations.

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