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In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM)
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Evaluation of InGaN/GaN light-emitting diodes of circular geometry

X H Wang1, W Y Fu, P T Lai

  • 1Semiconductor Display and Lighting Laboratory, Department of Electrical and Electronic Engineering The University of Hong Kong, Pokfulam Road, Hong Kong.

Optics Express
|January 7, 2010
PubMed

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