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Procedures for attenuated total reflection study of extremely small samples.

¹North American Aviation Science Center, Thousand Oaks, California 91360, USA.

|January 9, 2010

Summary

This summary is machine-generated.

Optimizing attenuated total reflectance (ATR) for trace samples requires specific optical conditions. This study provides formulas and designs for enhanced sensitivity with small sample analysis.

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Area of Science:

Spectroscopy
Analytical Chemistry
Materials Science

Background:

Attenuated Total Reflectance (ATR) spectroscopy is a powerful technique for analyzing small samples.
Enhancing the sensitivity of ATR for extremely small samples is crucial for various applications.

Purpose of the Study:

To discuss and optimize the conditions for high sensitivity ATR analysis of minute samples.
To adapt existing ATR formulas for thin films to the analysis of very small samples.

Main Methods:

Application and modification of Harrick and du Pré's thin film ATR formulas.
Determination of optimal optical material indices, sample indices, backing indices, and incidence angles for both light polarizations.
Proposal and analysis of novel optical systems for multiple reflections on the same sample spot.

Main Results:

Formulas for thin film ATR are applicable to extremely small samples with modifications.
Optimum optical parameters and incidence angles are determined for enhanced sensitivity.
Three innovative optical systems (trapezoidal plate, cylindrical cell, retroreflecting hemisphere) are proposed for multiple internal reflections.

Conclusions:

The study provides a framework for optimizing ATR sensitivity for trace sample analysis.
Novel optical designs offer practical solutions for repeated light-sample interactions, boosting sensitivity.
The principles can be extended to other spectroscopic techniques like reflection, transmission, and fluorescence.