Scanning Electron Microscopy
Preparation of Samples for Electron Microscopy
Overview of Microscopy Techniques
Atomic Emission Spectroscopy: Overview
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Updated: Jun 17, 2026

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)
Published on: February 10, 2021
Christine Lefrou1, Renaud Cornut
1LEPMI, Laboratoire d'Electrochimie et Physicochimie des Matériaux et des Interfaces, UMR 5631 CNRS-Grenoble-INP-Université Joseph Fourier, 1130 rue de la piscine, BP 75, Domaine Universitaire, 38402 Saint Martin d'Hères Cedex, France. christine.lefrou@grenoble-inp.fr
Scanning electrochemical microscopy (SECM) uses microelectrodes to analyze surfaces. This review compiles and evaluates analytical expressions for SECM feedback approach curves, crucial for interpreting experimental data.
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