Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Preparation of Samples for Electron Microscopy01:20

Preparation of Samples for Electron Microscopy

To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Atomic Emission Spectroscopy: Overview01:20

Atomic Emission Spectroscopy: Overview

Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Bifunctional coatings: coupling an organic adhesion promoter with an anticorrosion inorganic layer.

RSC advances·2022
Same author

Unraveling the Link between Catalytic Activity and Agglomeration State with Scanning Electrochemical Microscopy and Atomic Force Microscopy.

Analytical chemistry·2022
Same author

Ideal optical contrast for 2D material observation using bi-layer antireflection absorbing substrates.

Nanoscale·2019
Same author

Electronic Transport of MoS<sub>2</sub> Monolayered Flakes Investigated by Scanning Electrochemical Microscopy.

Chemphyschem : a European journal of chemical physics and physical chemistry·2017
Same author

Backside absorbing layer microscopy: Watching graphene chemistry.

Science advances·2017
Same author

Versatile Wafer-Scale Technique for the Formation of Ultrasmooth and Thickness-Controlled Graphene Oxide Films Based on Very Large Flakes.

ACS applied materials & interfaces·2015

Related Experiment Video

Updated: Jun 17, 2026

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)
08:31

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)

Published on: February 10, 2021

Analytical expressions for quantitative scanning electrochemical microscopy (SECM).

Christine Lefrou1, Renaud Cornut

  • 1LEPMI, Laboratoire d'Electrochimie et Physicochimie des Matériaux et des Interfaces, UMR 5631 CNRS-Grenoble-INP-Université Joseph Fourier, 1130 rue de la piscine, BP 75, Domaine Universitaire, 38402 Saint Martin d'Hères Cedex, France. christine.lefrou@grenoble-inp.fr

Chemphyschem : a European Journal of Chemical Physics and Physical Chemistry
|January 9, 2010
PubMed
Summary

Scanning electrochemical microscopy (SECM) uses microelectrodes to analyze surfaces. This review compiles and evaluates analytical expressions for SECM feedback approach curves, crucial for interpreting experimental data.

More Related Videos

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Scanning-probe Single-electron Capacitance Spectroscopy
10:53

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

Related Experiment Videos

Last Updated: Jun 17, 2026

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)
08:31

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)

Published on: February 10, 2021

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Scanning-probe Single-electron Capacitance Spectroscopy
10:53

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

Area of Science:

  • Electrochemistry
  • Analytical Chemistry
  • Surface Science

Background:

  • Scanning electrochemical microscopy (SECM) is an electrochemical technique developed in the 1990s.
  • SECM utilizes microelectrodes for surface analysis, presenting complex geometries.
  • Exact analytical expressions for simple SECM experiments like feedback approach curves are lacking.

Purpose of the Study:

  • To compile all available analytical expressions for SECM steady-state feedback experiments.
  • To critically evaluate the validity and applicability of existing analytical expressions.
  • To provide a comprehensive resource for SECM data interpretation.

Main Methods:

  • Literature review of analytical expressions for SECM feedback experiments.
  • Analysis of claimed general and approximate analytical expressions.
  • Discussion of expression validity based on current understanding and computational capabilities.

Main Results:

  • Identified and collected various analytical expressions used in SECM literature.
  • Highlighted discrepancies and limitations in existing expressions.
  • Assessed the applicability of different expressions under varying experimental conditions.

Conclusions:

  • A comprehensive collection of analytical expressions for SECM feedback experiments is presented.
  • The validity of existing expressions requires careful consideration of system geometry and approximations.
  • Further development and validation of analytical models are needed for accurate SECM data interpretation.