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Diffuse Reflectance Spectroscopy: Getting the Capillary Refill Test Under One's Thumb

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Published on: December 2, 2017

A bidirectional reflectance accessory for spectroscopic measurements.

G R Hunt¹, H P Ross

¹Lunar Planetary Research Branch,AFCRL, Bedford, Massachusetts 01370, USA.

|January 12, 2010

Summary

A new dual beam bidirectional reflectance attachment allows versatile sample analysis. This instrument is crucial for interpreting remote sensing data from Earth and other planets.

Area of Science:

Optics and Spectroscopy
Remote Sensing Technology
Materials Science

Background:

Bidirectional reflectance measurements are essential for understanding surface properties.
Existing methods may have limitations in sample versatility or incident light angles.
Interpreting remote sensing data requires accurate spectral information.

Purpose of the Study:

To describe a novel dual beam bidirectional reflectance attachment.
To demonstrate the attachment's capability for analyzing diverse sample types.
To validate the attachment's utility in remote sensing data interpretation.

Main Methods:

The attachment allows sample tilting to +/- 45 degrees.
Incident light impinges on the sample from above, enabling unrestricted sample types.

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Reflectance spectra and indicatrices were measured for various materials.

Main Results:

The attachment successfully acquired reflectance spectra for multiple materials.
Indicatrices for both specular and diffuse reflectors were generated.
The data obtained are suitable for remote sensing applications.

Conclusions:

The described dual beam bidirectional reflectance attachment offers significant advantages in sample versatility.
The instrument provides high-quality spectral data crucial for remote sensing.
This technology aids in the interpretation of terrestrial and planetary surface characteristics.